SEA/98-08 |
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RF Material Investigation by Sample Analysis |
Antoine C. |
Abstract: ========= Defects or impurities, surface or grain boundaries segregations, are known to be very harmful for superconducting materials, especially for RF applications. A wide range of techniques exists to explore either the global purity or very localized places of the material. This paper reviews some of the techniques which were used at Saclay or with close collaborators, along with their limitations and/or complementarity. Two domains are described : the behavior of material at cryogenic temperature, with our recent improvements in measuring the usual superconducting parameters and localized chemical analysis techniques. |